Publications

Search in: Author Title Conference Journal Keywords All

Go Back to Previous Page

Info for "Excess noise in sub-micron silicon FET: characterization, prediction and control "

Author: L. M. Franca-Neto and J. S. Harris
Reference Type: Conference Proceedings
Year Published: 1999

Conference Name: Proc. 29th European Solid-State Device Research Conference
Conference Location: Leuven, Belgium

     
 

Paul G. Allen Center for Integrated Systems, CISX-328, 420 Via Palou, Stanford University, Stanford, CA 94305-4075
Office phone: (650)723-0983 / Fax: (650)723-4659
Website Developed by: Stanford Internet Solutions ©2008