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Info for "Deep-level defects in MBE-grown Ga(As,N) layers "

Author: P. Krispin, S. G. Spruytte, J. S. Harris and K. H. Ploog
Reference Type: Journal Article
Link: Click Here
Year Published: 2001

Journal: 21st International Conference on Defects in Semiconductors. ICDS-21, 16-20 July 2001, Giessen, Germany , Volume 308/310 (Notes: M3: Article; M3: Conference Publication; M3: Journal article; Copyright 2008 Elsevier Engineering Information, Inc.; IEE; The Thomson Corporation )
Pages: 870-3
Author Address: Paul Drude Inst Festkorperelekt, Hausvogteipl 5-7, D-10117 Berlin, Germany; Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany; Stanford Univ, Solid State & Photon Lab, Stanford, CA 94305 USA

     
 

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