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Info for "Characterization of 0.5 mm thick films of orientation-patterned GaAs for nonlinear optical applications " Author: T. J. Pinguet, O. Levi, T. Skauli, L. A. A. E. L. A. Eyres, L. A. S. L. Scaccabarozzi, M. M. A. F. M. M. Fejer, J. S. A. H. J. S. Harris, T. J. A. K. T. J. Kulp, S. A. B. S. Bisson, B. A. G. B. Gerard, L. A. B. L. Becouarn and E. A. L. E. Lallier Reference Type: Conference Proceedings Year Published: 2001 Pages: 138

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Info for "Characterization of 0.5 mm thick films of orientation-patterned GaAs for nonlinear optical applications "