Publications

Search in: Author Title Conference Journal Keywords All

Go Back to Previous Page

Info for "Use of angle resolved x-ray photoelectron spectroscopy for determination of depth and thickness of compound layer structures "

Author: S. Spruytte, C. Coldren, J. Harris, D. Pantelidis, H. J. Lee, J. Bravman and M. Kelly
Reference Type: Journal Article
Link: Click Here
Year Published: 2001

Journal: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films , Volume 19 , Issue 2
Pages: 603-608

     
 

Paul G. Allen Center for Integrated Systems, CISX-328, 420 Via Palou, Stanford University, Stanford, CA 94305-4075
Office phone: (650)723-0983 / Fax: (650)723-4659
Website Developed by: Stanford Internet Solutions ©2008