Go Back to Previous Page
|
Info for "Arsenic surface segregation during in situ doped silicon and Si1-xGex molecular beam epitaxy
"Author: X. Liu, Q. Tang, J. S. Harris and T. I. Kamins
Reference Type: Journal Article Link: Click Here Year Published: 2005
Journal: Journal of Crystal Growth
, Volume 281
, Issue 2-4
(Notes: M3: Article; Copyright 2008 The Thomson Corporation
) Pages: 334-343
Author Address: Stanford Univ, Ctr Integrated Syst, Solid State & Photon Lab, Stanford, CA 94305 USA; Stanford Univ, Ctr Integrated Syst, Solid State & Photon Lab, Stanford, CA 94305 USA; Hewlett Packard Corp, Palo Alto, CA 94304 USA
|