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Info for "Temperature and humidity dependent reliability analysis of RGB LED chips "

Author: J.-X. Fu, S. Shukri and J. S. Harris
Reference Type: Conference Proceedings
Link: Click Here
Year Published: 2006

Conference Name: ISTFA 2006. Proceedings of the 32nd International Symposium for Testing and Failure Analysis, 12-16 Nov. 2006, Austin, TX, USA
Pages: p.137-41
Publisher: Materials Park, OH, USA : ASM International, 2006

     
 

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