Go Back to Previous Page
|
Info for "Rigorous Design of 22-nm Node 4-Terminal SOI FinFETs for Reliable Low Standby Power Operation with Semi-empirical Parameters"Author: Seongjae Cho, Shinichi O’uchi, Kazuhiko Endo, Sang Wan Kim, Younghwan Son, In Man Kang, Meishoku Masahara, James S. Harris, Jr., and Byung-Gook Park
Reference Type: Journal Article Link: Click Here Year Published: 2010
Journal: Journal of Semiconductor Technology and Science, Volume 10, Issue 4 Pages: 265-275
|