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Info for "Characterization of 0.5 mm Thick films of orientation-patterned GaAs for nonlinear optical applications"Author: T. Pinguet, T. Skauli, O. Levi, K. Vodopyanov, L.A. Eyres, L. Scaccabarozzi, M.M. Fejer, J.S. Harris, T.J. Kulp, S. Bisson, B. Gerard, L. Becouarn, and E. Lallier
Reference Type: Presentation Year Published: 2001
Event/Location Name: Conference on Lasers and Electro-Optics (CLEO) Location/City: Baltimore, MD Date: April, 2001 Invited: No
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