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Info for "Transmission Electron Microscopy (TEM) Structural Characterization of GaInNAs and GaInNAsSb Quantum Wells Grown by Molecular Beam Epitaxy (MBE)"

Author: T. Gugov, H. Yuen, S. Bank, M. Wistey, V. Gambin, J. S. Harris
Reference Type: Presentation
Year Published: 2004

Event/Location Name: 46th Electronic Materials Conference (EMC)
Location/City: Notre Dame/IN
Date: Jun. 2004
Invited: Yes

     
 

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