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Info for "Atomic force microscope nanoscale lithography for single-electron device applications "

Author: Y. Okada, S. Amano, M. Kawabe, B. N. Shimbo and J. S. Harris
Reference Type: Journal Article
Link: Click Here
Year Published: 1998

Journal: Compound Semiconductors 1997 , Volume 156 (Notes: M3: Article; Copyright 2008 The Thomson Corporation )
Pages: 577-580
Author Address: Univ Tsukuba, Inst Mat Sci, 1-1-1 Tennodai, Tsukuba, Ibaraki 305, Japan; Univ Tsukuba, Inst Mat Sci, Tsukuba, Ibaraki 305, Japan; Stanford Univ, Solid State Elect Lab, Stanford, CA 94305 USA

     
 

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