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Info for "X-ray diffraction analysis of step-graded InxGa1−xAs buffer layers grown by molecular beam epitaxy"

Author: Hai Lin, Yijie Huo, Yiwen Rong, Robert Chen, Theodore I. Kamins, James S. Harris
Reference Type: Journal Article
Link: Click Here
Year Published: 2011

Journal: Journal of Crystal Growth, Volume 323, Issue 1
Pages: 17-20

     
 

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