Go Back to Previous Page
Info for "X-ray diffraction analysis of step-graded InxGa1−xAs buffer layers grown by molecular beam epitaxy"
Author: Hai Lin, Yijie Huo, Yiwen Rong, Robert Chen, Theodore I. Kamins, James S. Harris
Reference Type: Journal Article
Link: Click Here
Year Published: 2011
Journal: Journal of Crystal Growth, Volume 323, Issue 1